Call for Papers
Interfacial Metrology for Organic Materials
231st ACS National Meeting Atlanta, March 26-30, 2006
Abstract/Preprint Deadline: November 13th, 2005
Proposed Session Topics:
- Surface and Interfacial Metrology
- Nano-Micro Scale Measurement Technology
- Complex Data Analysis Strategies
- Measurement Technology for Biomaterials / Biological Systems
- New Technology Resulting from Exploitation of Interfacial Phenomena
This symposium is dedicated to investigations of the chemistry, structure, morphology, and properties of organic materials in interfacial regions. It is well understood that the interfacial properties of a material can be significantly different than the bulk properties. Characterizing these interfacial regions is becoming increasingly important as the trend towards miniaturization and integration continues, leading to devices with an increasing number of interfaces and complex material formulations. Device performance is often dictated by the interfacial properties of a material. Examples include organic electronics which rely on a well organized dielectric layers, micro-electro-mechanical systems (MEMS) which rely on a thin lubricant layer to prevent adhesion, integrated circuits which rely on well controlled patterning of organic films, or biological systems which rely on interfacial regions to govern transport of critical molecules.
The purpose of this symposium is to assemble researchers from a wide range of technical disciplines into a forum where the wide array of metrology tools available to investigate the surfaces and interfaces in materials can be shared trough interesting examples of how these tools have been utilized to address specific problems. Presentations that utilize centralized user facilities such as nuclear reactors and synchrotron light sources, specialized or custom built laboratory equipment, or novel applications of commercially available equipment are all encouraged. The sessions will be broken into five major topical areas including: a) surface and interfacial metrology, b) nano-micro scale measurement technology, c) complex data analysis strategies, d) measurement technology for biomaterials / biological systems, and e) new technology resulting from exploitation of interfacial phenomena.
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