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In recent years polymer science has seen a marked increase in the use of imaging for materials characterization. New imaging approaches continue to expand the ability to image dynamic processes, to obtain ultra-high spatial resolution using far-field optics, and to obtain high-fidelity, 3D images. This symposium will focus on recent advances in instrumentation, including advances for optical, electron, and atomic force imaging. We will also focus on advances in image analysis, particularly in areas of tomography, holography, and extraction of quantitative materials parameters.

Titles, abstracts and preprints can be submitted online at

http://oasys.acs.org/acs/234nm/poly/papers/index.cgi

Preprint Template:

http://www.polyacs.org/main/preprintsonline.shtml

Symposium Co-Organizers:

Marcus Cicerone, NIST, cicerone@nist.gov
Hiroshi Jinnai, KIT, hjinnai@kit.ac.jp

Dr. Marcus T. Cicerone
+1.301.975.8104 (phone)
+1.301.975.4977 (fax)

nist polymers division
100 bureau drive
mailstop 8543
gaithersburg, md 20899-8543